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At least 343 records · Page 19Linked to original sources

Clinical applications of scanning electron microscopy (SEM) in North America with emphasis on SEM's role in comparative microscopy.

This paper contains an account of the clinical applications of the scanning electron microscope (SEM) in North American based on the available literature and personal experience. The role of SEM's contributions through comparative microscopy is stressed rather than a definitive diagnostic role. (Few tests are definitive) Therefore, situations where the application of SEM has been beneficial in day to day diagnostic problems are cited using the imaging modes of SEM as a format. The role of SEM in studying autopsy material is not discussed. Autopsy material has both strengths and weakness, as well as a special time frame, and is worthy of its own separate discussion.

Diagnostic Techniques and Procedures↗

A complementary-metal-oxide-semiconductor-field-effect-transistor-compatible atomic force microscopy tip fabrication process and integrated atomic force microscopy cantilevers fabricated with this process.

A complementary-metal-oxide-semiconductor-field-effect-transistor-compatible process for the fabrication of atomic force microscopy cantilevers with integrated tips has been developed. For the first time, the tips are fabricated after the completion of the regular complementary metal-oxide-semiconductor-field-effect-transistor fabrication process sequence. On-chip circuit components, such as piezoresistive deflection sensors, deflection actuators, and amplifiers, are fabricated on the mirror-polished surface of the wafer, ensuring optimal performance. The tip fabrication process is based on anisotropic silicon etching at low temperature using a tetramethylammonium hydroxide solution. The anisotropic etching process has been optimized to ensure process controllability. Using the described process, complementary-metal-oxide-semiconductor-field-effect-transistor-based cantilevers with piezoresistive deflection sensors and integrated tips have been successfully fabricated. Force-distance curves and scanning images in constant-force mode have been recorded.

Journal Article↗

Correlative Instrumental Neutron Activation Analysis, Light Microscopy, Transmission Electron Microscopy, and X-ray Microanalysis for Qualitative and Quantitative Detection of Colloidal Gold Spheres in Biological Specimens.

: Colloidal gold, conjugated to ligands or antibodies, is routinely used as a label for the detection of cell structures by light (LM) and electron microscopy (EM). To date, several methods to count the number of colloidal gold labels have been employed with limited success. Instrumental neutron activation analysis (INAA), a physical method for the analysis of the elemental composition of materials, can be used to provide a quantitative index of gold accumulation in bulk specimens. Given that gold is not naturally found in biological specimens in any substantial amount and that colloidal gold and ligand conjugates can be prepared to yield uniform bead sizes, the amount of label can be calculated in bulk biological samples by INAA. Here we describe the use of INAA, LM, transmission EM, and X-ray microanalysis (EDX) in a model to determine both distribution (localization) and amount of colloidal gold at the organ, tissue, cellular, and ultrastructural levels in whole animal systems following administration. In addition, the sensitivity for gold in biological specimens by INAA is compared with that of inductively coupled plasma-mass spectrometry (ICP-MS). The correlative use of INAA, LM, TEM, and EDX can be useful, for example, in the quantitative and qualitative tracking of various labeled molecular species following administration in vivo.

Journal Article↗

Direct imaging of meniscus formation in atomic force microscopy using environmental scanning electron microscopy.

Environmental scanning electron microscopy was used to image meniscus formation between an AFM tip and a surface. At high relative humidity, 70%-99%, the meniscus formed is 100 to 1200 nm in height, orders of magnitude larger than predicted by the Kelvin equation using spherical geometry. The height of the meniscus also demonstrates hysteresis associated with increasing or decreasing relative humidity.

Letter↗

Nanowire probes for high resolution combined scanning electrochemical microscopy - atomic force microscopy.

We describe a method for the production of nanoelectrodes at the apex of atomic force microscopy (AFM) probes. The nanoelectrodes are formed from single-walled carbon nanotube AFM tips which act as the template for the formation of nanowire tips through sputter coating with metal. Subsequent deposition of a conformal insulating coating, and cutting of the probe end, yields a disk-shaped nanoelectrode at the AFM tip apex whose diameter is defined by the amount of metal deposited. We demonstrate that these probes are capable of high-resolution combined electrochemical and topographical imaging. The flexibility of this approach will allow the fabrication of nanoelectrodes of controllable size and composition, enabling the study of electrochemical activity at the nanoscale.

Journal Article↗

Characterization of reflection scanning near-field optical microscopy and scanning tunnelling optical microscopy/photon scanning tunnelling microscopy working in preliminary approach constant height scanning mode.

The resolution in near-field images is currently determined by the visual inspection of recorded images. One of the major questions in near-field optical microscopy is 'what resolution can be reached, the tip-to-sample distance being known?' This knowledge is critical when choosing the scanning step and the distance between the tip and the sample, in a preliminary scan. This preliminary scan is often the only way to detect the interesting parts of the sample, with limited risk of tip crash and topographical artefacts. The method proposed here needs two scans of the same area, of the same sample, in constant height mode, recorded at two tip-to-sample distances. The pseudotransfer function is the ratio of the Fourier transform of these two data maps. This function enables the evaluation of the limit of resolution. Theoretical considerations are introduced to assess the method.

Journal Article↗