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PubMed · 2778525

Practical phase identification by convergent beam electron diffraction.

J Mansfield
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Abstract

The purpose of this article is to present a practical guide to the identification of phases in the analytical electron microscope with the aid of convergent beam electron diffraction. There is included a step-by-step approach to phase analysis, from the possible choices of the form of the specimen through how to explore reciprocal space in order to perform a full phase identification, either by symmetry analysis or by simple comparison of a pattern observed in the microscope with a previously recorded pattern (fingerprinting). There is a strong emphasis on practical hints and useful shortcuts.

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CrystallographyElectronsMicroscopy, ElectronSpecimen HandlingJournal Article

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BibTeXRIS

J Mansfield. 1989. Practical phase identification by convergent beam electron diffraction.. https://doi.org/10.1002/jemt.1060130104

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