TY  - RPRT
TI  - X-ray diffraction from laterally structured surfaces: Total external reflection.
AU  - M Tolan
AU  - W Press
AU  - F Brinkop
AU  - JP Kotthaus
PY  - 1995
DO  - 10.1103/physrevb.51.2239
UR  - https://pubmed.ncbi.nlm.nih.gov/9978973/
ID  - 9978973
ER  -