TY  - RPRT
TI  - Two-scale model for aggregation and etching.
AU  - GC John
AU  - VA Singh
PY  - 1996
DO  - 10.1103/physreve.53.3920
UR  - https://pubmed.ncbi.nlm.nih.gov/9964704/
ID  - 9964704
ER  -