TY  - RPRT
TI  - Atomic-layer by atomic-layer compositional depth profiling: Surface segregation and impurity cosegregation of Pt-Rh and Pt-Ru alloys.
AU  - TT Tsong
AU  - DM Ren
AU  - M Ahmad
PY  - 1988
DO  - 10.1103/physrevb.38.7428
UR  - https://pubmed.ncbi.nlm.nih.gov/9945467/
ID  - 9945467
ER  -