TY  - RPRT
TI  - Monitoring small defects on surface microstructures through backscattering measurements.
AU  - P Albella
AU  - F Moreno
AU  - J M Saiz
AU  - F González
PY  - 2006
DO  - 10.1364/ol.31.001744
UR  - https://pubmed.ncbi.nlm.nih.gov/16688281/
ID  - 16688281
ER  -