@misc{indiciae32c297df4acf,
  title = {Monitoring small defects on surface microstructures through backscattering measurements.},
  author = {P Albella and F Moreno and J M Saiz and F González},
  year = {2006},
  doi = {10.1364/ol.31.001744},
  url = {https://pubmed.ncbi.nlm.nih.gov/16688281/},
  note = {Source identifier: 16688281}
}