TY  - RPRT
TI  - Impurity distribution in a solid-liquid interface during static layer crystallization.
AU  - Kwang-Joo Kim
AU  - Joachim Ulrich
PY  - 2002
DO  - 10.1006/jcis.2002.8353
UR  - https://pubmed.ncbi.nlm.nih.gov/16290774/
ID  - 16290774
ER  -