TY  - RPRT
TI  - Electron interferometry at a metal-semiconductor interface.
AU  - JA Kubby
AU  - WJ Greene
PY  - 1992
DO  - 10.1103/physrevlett.68.329
UR  - https://pubmed.ncbi.nlm.nih.gov/10045864/
ID  - 10045864
ER  -