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Biomedical subjects

Wenge Yang

Publications and source records attributed to Wenge Yang.

9 recordsLinked to original sources

X-ray microbeam measurements of individual dislocation cell elastic strains in deformed single-crystal copper.

The distribution of elastic strains (and thus stresses) at the submicrometre length scale within deformed metal single crystals has remarkably broad implications for our understanding of important physical phenomena. These include the evolution of the complex dislocation structures that govern mechanical behaviour within individual grains, the transport of dislocations through such structures, changes in mechanical properties that occur during reverse loading (for example, sheet-metal forming and fatigue), and the analyses of diffraction line profiles for microstructural studies of these phenomena. We present the first direct, spatially resolved measurements of the elastic strains within individual dislocation cells in copper single crystals deformed in tension and compression along <001> axes. Broad distributions of elastic strains are found, with important implications for theories of dislocation structure evolution, dislocation transport, and the extraction of dislocation parameters from X-ray line profiles.

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Chaos in an electromagnetically induced transparent medium inside an optical cavity.

We theoretically predict and experimentally demonstrate chaotic behaviors in a system comprising of three-level atoms inside an optical ring cavity. This electromagnetically induced transparency (EIT) system is driven to chaos through period-doubling route by reducing the frequency detuning of the coupling laser beam. The chaos occurs in a different parametric regime as previously predicted and is believed to be caused by the enhanced dispersion and nonlinearity due to induced atomic coherence in such EIT system.

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Dynamical hysteresis in a three-level atomic system.

We have experimentally investigated dynamical hysteresis behavior by changing the sweeping frequency of the cavity input field in the optical bistability of rubidium atoms (in a three-level atomic-type configuration) inside an optical cavity. The shape, width (or area), and direction of the hysteresis cycle are sensitive functions of the sweeping frequency for such an optical bistable system.

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Nondestructive three-dimensional characterization of grain boundaries by X-ray crystal microscopy.

The results from an emerging method of nondestructive grain boundary characterization, with unprecedented sensitivity to neighbor-grain misorientation and grain boundary morphology are reported. The method utilizes differential aperture X-ray microscopy to determine the local crystallographic orientation of submicron volumes within polycrystalline materials. Initial measurements are described for a recrystallized Ni sample where the grain boundary type was identified at 85 grain boundaries within the framework of an ideal coincident site lattice (CSL) model. The remarkable resolution of this method is demonstrated by the <0.03 degrees deviations of misorientation measured for Sigma3 (twin) boundaries. Because of its high angular and spatial resolution, this new approach to grain boundary characterization can provide quantitative tests of grain boundary models with new insights for grain boundary engineering efforts.

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Simple method for frequency locking of an extended-cavity diode laser.

We have developed an extended-cavity tunable diode laser system that has a small linewidth and a large output power (more than 90% of the free-running power) whose operating frequency can be conveniently locked to a transition line of Rb atoms. Based on flat-mirror feedback and frequency self-locking and with weak feedback, we have achieved a continuous frequency detuning range greater than 900 MHz and a short-time linewidth stability of better than 0.4%. By using a two-step locking procedure we not only can lock the laser frequency but also can detune the frequency to any desired value. The locking is quite sturdy and rugged.

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Enhancement of the cavity ringdown effect based on electromagnetically induced transparency.

We show that the unique absorption and dispersion properties of the electromagnetically induced transparency can be used effectively to relax the conditions for observing the cavity ringdown effect (CRE), which can be useful in applications of CRE in ultrasensitive detection of chemical species. A more straightforward and simple method is used to model the interesting CRE.

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Differential-aperture X-ray structural microscopy: a submicron-resolution three-dimensional probe of local microstructure and strain.

A recently developed differential-aperture X-ray microscopy (DAXM) technique provides local structure and crystallographic orientation with submicron spatial resolution in three-dimensions; it further provides angular precision of approximately 0.01 degrees and local elastic strain with an accuracy of approximately 1.0 x 10(-4) using microbeams from high brilliance third generation synchrotron X-ray sources. DAXM is a powerful tool for inter- and intra-granular studies of lattice distortions and lattice rotations on mesoscopic length scales of tenths of microns to hundreds of microns that are largely above the range of traditional electron microscopy probes. Nondestructive, point-to-point, spatially resolved measurements of local lattice orientations in bulk materials provide direct information on geometrically necessary dislocation density distributions through measurements of the lattice curvature in plastically deformed materials. This paper reviews the DAXM measurement technique and discusses recent demonstrations of DAXM capabilities for measurements of microtexture, local elastic strain, and plastic deformation microstructure.

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X-ray microdiffraction study of growth modes and crystallographic tilts in oxide films on metal substrates.

The crystallographic texture of thin-film coatings plays an essential role in determining such diverse materials properties as wear resistance, recording density in magnetic media and electrical transport in superconductors. Typically, X-ray pole figures provide a macroscopically averaged description of texture, and electron backscattering provides spatially resolved surface measurements. In this study, we have used focused, polychromatic synchrotron X-ray microbeams to penetrate multilayer materials and simultaneously characterize the local structure, orientation and strain tensor of different heteroepitaxial layers with submicrometre resolution. Grain-by-grain microstructural studies of cerium oxide films grown on textured nickel foils reveal two distinct kinetic growth regimes on vicinal surfaces: ledge growth at elevated temperatures and island growth at lower temperatures. In addition, a combinatorial approach reveals that crystallographic tilting associated with these complex interfaces is qualitatively described by a simple geometrical model applicable to brittle films on ductile substrates. The sensitivity of conducting percolation paths to tilt-induced texture improvement is demonstrated.

Cerium↗

Three-dimensional X-ray structural microscopy with submicrometre resolution.

Advanced materials and processing techniques are based largely on the generation and control of non-homogeneous microstructures, such as precipitates and grain boundaries. X-ray tomography can provide three-dimensional density and chemical distributions of such structures with submicrometre resolution; structural methods exist that give submicrometre resolution in two dimensions; and techniques are available for obtaining grain-centroid positions and grain-average strains in three dimensions. But non-destructive point-to-point three-dimensional structural probes have not hitherto been available for investigations at the critical mesoscopic length scales (tenths to hundreds of micrometres). As a result, investigations of three-dimensional mesoscale phenomena--such as grain growth, deformation, crumpling and strain-gradient effects--rely increasingly on computation and modelling without direct experimental input. Here we describe a three-dimensional X-ray microscopy technique that uses polychromatic synchrotron X-ray microbeams to probe local crystal structure, orientation and strain tensors with submicrometre spatial resolution. We demonstrate the utility of this approach with micrometre-resolution three-dimensional measurements of grain orientations and sizes in polycrystalline aluminium, and with micrometre depth-resolved measurements of elastic strain tensors in cylindrically bent silicon. This technique is applicable to single-crystal, polycrystalline, composite and functionally graded materials.

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