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Biomedical subjects

Peter Rez

Publications and source records attributed to Peter Rez.

3 recordsLinked to original sources

Comparison of phase contrast transmission electron microscopy with optimized scanning transmission annular dark field imaging for protein imaging.

Henderson has already shown that electron microscopy should be superior to X-ray and neutron diffraction for determining protein structure with minimum radiation damage. Since the contrast for a molecule embedded in vitreous ice is very low, it is conceivable that dark field imaging would be superior to bright field phase contrast microscopy. A detailed analysis of contrast and signal/noise for both imaging modes is presented. Annular dark field scanning transmission microscopy gives improved contrast and equivalent signal/noise to phase contrast TEM when the molecule is the same thickness as a vitreous ice embedding medium. For a constant embedding medium thickness of 200 A the contrast is equivalent to phase contrast TEM but the signal/noise is 5 times worse. Even with an efficient detector that only excludes scattering less than 5 mrad there is insufficient signal at a dose of 5 electrons/A(2) to produce an image with more than 1 electron/per pixel. For larger molecules (>100 A thick which corresponds to 420 kDa for spherical molecules) the weak phase object approximation used to analyse a phase contrast image no longer applies at 100 kV. This limit could be extended to about 200 A (about 3 MDa) if a 400 kV microscope were used.

Algorithms↗

Electron ionization cross sections for atomic subshells.

Ionization of atoms is the first step in many analytical procedures. The cross section for ionizing a particular atomic shell is essential for calculating the magnitude of analytical signals. Calculations using atomic wave functions for various shells of all elements relevant for X-ray microanalysis over a range of electron energies up to 400 keV were performed. The calculations for high energies above threshold can be considerably simplified by using the mathematical form of the Bethe ridge that dominates the scattering in this region. Corrections for exchange at low energies above threshold are incorporated in these calculations. A selection of results showing the effects of different approximations on ionization cross sections for K, L, and M shells is presented.

Electron Probe Microanalysis↗

Scattering Cross Sections in Electron Microscopy and Analysis.

The scattering cross section is the fundamental measure of the strength of a scattering interaction. All scattering in electron microscopy arises from the Coulomb interaction, and scattering cross sections, whether elastic or inelastic, will therefore all have common features. Simple forms of both elastic and inelastic cross sections are reviewed in the context of high resolution and analytical microscopy. Some recent developments, such as the calculation of Fano resonances in electron energy loss spectra of transition metals and rare earth elements are also discussed.

Journal Article↗