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M Rühle

Publications and source records attributed to M Rühle.

6 recordsLinked to original sources

Valence electron energy loss study of Fe-doped SrTiO3 and a sigma13 boundary: electronic structure and dispersion forces.

Valence electron energy loss spectroscopy in a dedicated scanning transmission electron microscope has been used to obtain the interband transition strength of a sigma13 tilt grain boundary in SrTiO3. In a first step the electronic structure of bulk SrTiO3 has been analysed quantitatively by comparing VEELS spectra with vacuum ultraviolet spectra and with ab initio density of states calculations. The electronic structure of a near sigma13 grain boundary and the corresponding dispersion forces were then determined by spatially resolved VEELS. Also the effects of delocalization of the inelastic scattering processes were estimated and compared with results from the literature.

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Core-hole effect in the ELNES of alpha-Al2O3: experiment and theory.

The occurrence of the core-hole effect at the Al-K and Al-L1 edge in alpha-Al2O3 was studied by comparing experimental electron energy-loss near-edge structures (ELNES) and results of band-structure calculations with and without accounting for core-hole effects by the Z + 1 approximation. It was found that the theoretically calculated unoccupied p-like projected densities of states (PDOS) without Z + 1 approximation matches better to the experimental Al-L1 ELNES, whereas the PDOS with Z + 1 approximation matches better to the experimental Al-K ELNES. We conclude that the localisation of the initial state is an important prerequisite for the observability of the core-hole effect in the ELNES.

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High-precision assessment of interface lattice offset by quantitative HRTEM.

We introduce a new method to determine the 'lattice offset' or 'rigid-body shift' between two crystals forming an interface. Our method relies on quantitative evaluation of high-resolution transmission electron microscopy images. Employing the (001)-orientated interface between Al and MgAl2O4 in parallel orientation as a model system we demonstrate that we can assess the interface lattice offset with a precision in the picometre range.

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Quantitative analysis of valence electron energy-loss spectra of aluminium nitride.

The optical properties and electronic structure of aluminium nitride are determined using valence electron energy-loss spectroscopy in a dedicated scanning transmission electron microscope. Quantitative analysis of the experimental valence electron energy-loss spectra to determine the electronic structure encompasses single scattering deconvolution of the valence electron energy-loss spectra to calculate the energy-loss function, Kramers-Kronig analysis of the energy-loss function to reveal the complex dielectric function, transformation of the dielectric function into the optical interband transition strength via optical property relations and finally critical-point analysis of the interband transition strength. The influence of both experimental and analytical parameters on the final result was studied systematically to define and improve the understanding of the methods. To check the reliability of this technique the interband transition strength determined was compared with results of vacuum ultraviolet spectroscopy. Good agreement was found if sample preparation was taken into account. The preparation of the specimen for the transmission electron microscopy has an effect on the electronic structure. Quantitative analysis of valence electron energy-loss spectroscopy, using the methods presented, is an important and capable method to determine the electronic structure of materials and it has the benefit of high spatial resolution.

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