Amplitude-division three-electron-wave interference for observing pure phase objects having low spatial frequency.
A new interferometry is presented for direct visualization of pure phase objects having low spatial frequency, such as electromagnetic microfields. A thin crystal of silicon prepared using argon ion milling is installed at the standard specimen position. This silicon crystal works as an electron beam splitter and forms diffraction spots in the back focal plane. Using the objective aperture, [000], [111] and [111] spots are selected as coherent electron sources to illuminate the specimen located at the area-selecting aperture position. The lattice image of silicon is formed below the area-selecting aperture position by decreasing the electric current of the objective lens. Three defocused images of the specimen are observed in the fluorescent screen by overexciting the first intermediate lens. We have successfully visualized equipotential lines around a latex particle charged by electron beam irradiation. The computer-simulated image was consistent with the experimental image.