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Joseph J M Braat

Publications and source records attributed to Joseph J M Braat.

10 recordsLinked to original sources

Chromatism compensation in wide-band nulling interferometry for exoplanet detection.

We introduce the concept of chromatism compensation in nulling interferometry that enables a high rejection ratio in a wide spectral band. Therefore the achromaticity condition considered in most nulling interferometers can be relaxed. We show that this chromatism compensation cannot be applied to a two-beam nulling interferometer, and we make an analysis of the particular case of a three-telescope configuration.

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Extended Nijboer-Zernike approach to aberration and birefringence retrieval in a high-numerical-aperture optical system.

The judgment of the imaging quality of an optical system can be carried out by examining its through-focus intensity distribution. It has been shown in a previous paper that a scalar-wave analysis of the imaging process according to the extended Nijboer-Zernike theory allows the retrieval of the complex pupil function of the imaging system, including aberrations as well as transmission variations. However, the applicability of the scalar analysis is limited to systems with a numerical aperture (NA) value of the order of 0.60 or less; beyond these values polarization effects become significant. In this scalar retrieval method, the complex pupil function is represented by means of the coefficients of its expansion in a series involving the Zernike polynomials. This representation is highly efficient, in terms of number and magnitude of the required coefficients, and lends itself quite well to matching procedures in the focal region. This distinguishes the method from the retrieval schemes in the literature, which are normally not based on Zernike-type expansions, and rather rely on point-by-point matching procedures. In a previous paper [J. Opt. Soc. Am. A 20, 2281 (2003)] we have incorporated the extended Nijboer-Zernike approach into the Ignatowsky-Richards/Wolf formalism for the vectorial treatment of optical systems with high NA. In the present paper we further develop this approach by defining an appropriate set of functions that describe the energy density distribution in the focal region. Using this more refined analysis, we establish the set of equations that allow the retrieval of aberrations and birefringence from the intensity point-spread function in the focal volume for high-NA systems. It is shown that one needs four analyses of the intensity distribution in the image volume with different states of polarization in the entrance pupil. Only in this way will it be possible to retrieve the "vectorial" pupil function that includes the effects of birefringence induced by the imaging system. A first numerical test example is presented that illustrates the importance of using the vectorial approach and the correct NA value in the aberration retrieval scheme.

Algorithms↗

Shaping with fluid jet polishing by footprint optimization.

We report on a way to shape surfaces with fluid jet polishing by adjusting the influence function (the shape of the footprint of the nozzle) instead of changing the dwell time of the nozzle on the surface. In that way, the surface is processed homogeneously, and no dip is generated in the center of the workpiece. As a proof of this approach, a lambda/10 flat surface has been generated in our laboratory.

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Analysis, search, and classification for reflective ring-field projection systems.

Extreme ultraviolet (EUV) lithography uses reflective ring-field projection systems. Geometrical obstruction limits the possible system configurations to small domains of the parameter space. We present an analysis, a search method, and a classification of these unobstructed domains. The exhaustive search method based on paraxial analysis provides an effective means for determining all possible design forms and for finding useful starting configurations for optimization. The approach is validated through comparison with finite ray tracing.

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Wave-front correction methods for extreme-ultraviolet multilayer reflectors.

In this theoretical study we show that by removing or depositing additional multilayer (ML) periods of a thin-film interference coating, distortions in the reflected wave front induced by surface figure errors can be corrected. At lambda = 13.4 nm in the extreme-ultraviolet region the removal or deposition of a single period of the standard two-component molybdenum-silicon (Mo/Si) ML interference coating induces an effective phase change of magnitude 0.043pi with respect to an identical optical thickness in vacuum. The magnitude of this wave-front shift can be enhanced with multicomponent MLs optimized for phase change on reflection. We briefly discuss the contributions of the shift in the effective reflection surface of the ML on the phase change. We also predict the feasibility of novel phase-shifting mask for subwavelength imaging applications.

Journal Article↗

Deep nulling by means of multiple-beam recombination.

Direct detection of exoplanets is possible by use of a technique called nulling interferometry, which is based on destructive interference of light of the bright object and constructive interference of the faint object. In the infrared wavelength region, this implies that light of a star must be attenuated by a certain factor, the so-called rejection ratio, which typically equals 10(6). This can be achieved by use of phase shifters, which apply a phase shift of pi rad with an average error nogreater than 2 mradover a predefined wavelength region. For a 6-18-microm wavelength interval, this is a tough constraint. We show that the 2-mrad constraint can be relaxed if more than two beams participate in the beam recombination. We focus our attention on dispersive phase shifters and show that rejection ratios beyond 10(6) can be reached easily by use of a system of four or more apertures and simple dispersive phase shifters that consist of only one material.

Journal Article↗

Extended Nijboer-Zernike representation of the vector field in the focal region of an aberrated high-aperture optical system.

Taking the classical Ignatowsky/Richards and Wolf formulas as our starting point, we present expressions for the electric field components in the focal region in the case of a high-numerical-aperture optical system. The transmission function, the aberrations, and the spatially varying state of polarization of the wave exiting the optical system are represented in terms of a Zernike polynomial expansion over the exit pupil of the system; a set of generally complex coefficients is needed for a full description of the field in the exit pupil. The field components in the focal region are obtained by means of the evaluation of a set of basic integrals that all allow an analytic treatment; the expressions for the field components show an explicit dependence on the complex coefficients that characterize the optical system. The electric energy density and the power flow in the aberrated three-dimensional distribution in the focal region are obtained with the expressions for the electric and magnetic field components. Some examples of aberrated focal distributions are presented, and some basic characteristics are discussed.

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Fresnel diffraction effects in the frontlight for a liquid-crystal display.

In a new type of illumination system for reflective liquid-crystal displays, the frontlight, unwanted shadows appear in certain viewing directions. It will be shown that for an accurate description of these shadows the geometrical optics approach is not satisfactory and that Fresnel diffraction has to be taken into account. A model for the diffraction effects was developed, and the predicted results correspond well to the measurements. In addition, some remarkable effects were explained from the theory of Fresnel zones.

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Nulling interferometry without achromatic phase shifters.

In the infrared wavelength region, a typical star is approximately a million times brighter than the planet that surrounds it, which is a major problem when we attempt to detect exoplanets in a direct manner. Nulling interferometry is a technique that one can use to solve this problem by attenuating the stellar light and enhancing that of the planet. Generally, deep nulling is achieved by use of achromatic phase shifters (APSs). Unfortunately, the technology needed to build these APSs is not yet fully developed. We show that deep nulling can also be achieved by using delay lines only. We investigate the nulling depth as a function of the width of the wavelength interval and the number of telescopes. We also show that we can obtain nulling depths of less than 10(-6), which are required for exoplanet detection. Furthermore, we investigate the properties of the transmission map and make a comparison between our system and an APS system.

Journal Article↗

iTIRM as a tool for qualifying polishing processes.

We report on what we believe to be a novel classification method for polishing processes that we apply in our laboratory on a regular basis. Two parameters are deduced from the in situ iTIRM (intensity-detecting total-internal-reflection microscopy) measurement method. Contrary to Preston's law, which gives the removal rate, the parameters of the iTIRM process are a measure of the change in surface quality (roughness, subsurface damage, and scratch and dig) and the duration of the polishing process.

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