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Jeffrey O White

Publications and source records attributed to Jeffrey O White.

5 recordsLinked to original sources

Phase correction of interferograms using digital all-pass filters.

A method for the phase correction of interferograms in Fourier transform infrared spectroscopy is presented. It is shown that phase error can be canceled to within an arbitrary angular precision by a low-order digital all-pass filter. Such a filter only modifies the phase of the Fourier transform of the interferogram and keeps the magnitude unchanged, like the Mertz method, for example. However, our method minimizes the asymmetric apodization that results in photometric errors when using the Mertz method alone. A practical example is provided in which phase correction over a frequency range of 800 cm(-1) to 4000 cm(-1) using a 9-pole all-pass filter resulted in a photometric error of <0.01%, much less than the 0.3% error of the Mertz method. An alternative and faster (approximately 100 ms) approach is to use an all-pass filter with lower angular precision followed by the Mertz method. Removing most of the phase error with the filter brings the interferogram to an optimal state so that the residual phase error can be completely removed with the Mertz procedure without introducing photometric error. The method can be used in most experiments, including emission spectroscopy, where conventional techniques are inadequate. A simple all-pass filter design algorithm is given.

Algorithms↗

Thermal conductivity imaging at micrometre-scale resolution for combinatorial studies of materials.

Combinatorial methods offer an efficient approach for the development of new materials. Methods for generating combinatorial samples of materials, and methods for characterizing local composition and structure by electron microprobe analysis and electron-backscatter diffraction are relatively well developed. But a key component for combinatorial studies of materials is high-spatial-resolution measurements of the property of interest, for example, the magnetic, optical, electrical, mechanical or thermal properties of each phase, composition or processing condition. Advances in the experimental methods used for mapping these properties will have a significant impact on materials science and engineering. Here we show how time-domain thermoreflectance can be used to image the thermal conductivity of the cross-section of a Nb-Ti-Cr-Si diffusion multiple, and thereby demonstrate rapid and quantitative measurements of thermal transport properties for combinatorial studies of materials. The lateral spatial resolution of the technique is 3.4 microm, and the time required to measure a 100 x 100 pixel image is approximately 1 h. The thermal conductivity of TiCr(2) decreases by a factor of two in crossing from the near-stoichiometric side of the phase to the Ti-rich side; and the conductivity of (Ti,Nb)(3)Si shows a strong dependence on crystalline orientation.

Combinatorial Chemistry Techniques↗

Infrared-visible sum frequency generation investigation of Cu corrosion inhibition with benzotriazole.

Infrared-visible sum frequency generation spectroscopy is used to investigate the corrosion inhibitor benzotriazole (BTAH) adsorbed on Cu(100) and Cu(111) in acidic solution. Potential-dependent in situ spectra indicate that the adsorbed molecule is the benzotriazole anion (BTA-) at all potentials investigated. The Cu(100) surface is shown to form an ordered adlayer at all potentials probed, while the Cu(111) face is shown to be disordered at negative potentials, but to order with applied positive potential. The ordered adlayer is shown to consist of the BTA- in two configurations, one coordinated to the surface and Cu+ ions in solution and the other coordinated only to the surface. The BTA- coordinated to Cu+ is shown to be more stable with respect to Cl- addition than BTA- coordinated to only the surface. This study demonstrates the viability of using sum frequency generation to study corrosion inhibition in situ.

Journal Article↗

Diffraction-based solid immersion lens.

A solid immersion lens based on diffraction (dSIL) is proposed as an alternative to the conventional design based on refraction. A design analogous to a Fresnel zone plate is derived in accordance with the Huygens-Fresnel principle. Fabrication of a binary dSIL is achieved by electron-beam lithography and reactive-ion etching on LaSF35, with index n = 2.014. Measurement of the point-spread function is performed with near-field optical microscopy. The results are in accord with the expected resolution enhancement of a factor n with respect to the diffraction limit.

Journal Article↗