Surface-stress-induced order in SiGe alloy films.
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Biomedical subjects
FK LeGoues
Publications and source records attributed to FK LeGoues.
Spectroscopic ellipsometry of E1-like transitions in nanometer-thickness Ge layers.
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Long-range order in thick, unstrained Si0.5Ge0.5 epitaxial layers.
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Novel strain-induced defect in thin molecular-beam epitaxy layers.
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Structural characterization of the Si(111)-CaF2 interface by high-resolution transmission electron microscopy.
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Orientation dependence of grain-boundary critical currents in YBa2Cu3O7- delta bicrystals.
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Properties of epitaxial films of YBa2Cu3O7- delta.
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Influence of thin SiO2 interlayers on chemical reaction and microstructure at the Ni/Si(111) interface.
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High-temperature SiO2 decomposition at the SiO2/Si interface.
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Correlation of Schottky-barrier height and microstructure in the epitaxial Ni silicide on Si(111).
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