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Earl J Kirkland

Publications and source records attributed to Earl J Kirkland.

2 recordsLinked to original sources

Room design for high-performance electron microscopy.

Aberration correctors correct aberrations, not instabilities. Rather, as spatial resolution improves, a microscope's sensitivity to room environment becomes more noticeable, not less. Room design is now an essential part of the microscope installation process. Previously ignorable annoyances like computer fans, desk lamps and that chiller in the service corridor now may become the limiting factors in the microscopes performance. We discuss methods to quantitatively characterize the instrument's response to magnetic, mechanical, acoustical and thermal disturbances and thus predict the limits that the environment places on imaging and spectroscopy.

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Some effects of electron channeling on electron energy loss spectroscopy.

As an electron beam (of order 100 keV) travels through a crystalline solid it can be channeled down a zone axis of the crystal to form a channeling peak centered on the atomic columns. The channeling peak can be similar in size to the outer atomic orbitals. Electron energy loss spectroscopy (EELS) measures the losses that the electron experiences as it passes through the solid yielding information about the unoccupied density of states in the solid. The interaction matrix element for this process typically produces dipole selection rules for small angle scattering. In this paper, a theoretical calculation of the EELS cross section in the presence of strong channeling is performed for the silicon L23 edge. The presence of channeling is found to alter both the intensity and selection rules for this EELS signal as a function of depth in the solid. At some depths in the specimen small but significant non-dipole transition components can be produced, which may influence measurements of the density of states in solids.

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