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Biomedical subjects

D C Joy

Publications and source records attributed to D C Joy.

13 recordsLinked to original sources
PubMed2002

SMART--a program to measure SEM resolution and imaging performance.

It is important to be able to measure the parameters, such as spatial resolution, astigmastism, signal-to-noise ratio, and drift and instability, that characterize the performance of a scanning electron microscope. These quantities can be determined most reliably by a Fourier analysis of digital micrographs from the instrument, recorded under conditions of interest. A program designed to implement all of the necessary steps in an automated manner has been developed as a 'macro' for the popular, and freely available, NIH Image and SCION Image programs.

Journal Article↗
PubMed1998

The efficiency of X-ray production at low energies.

The absolute efficiency of X-ray production has been determined for the K-lines of Al, Si and Cu; for the L-lines of Fe, Co, Cu, Ge and As; and for the M-lines of Hf, Ir, Pt, Au and Bi, using overvoltage ratios in the range 1-10. These emissions, with the exception of the Cu K, have critical excitation energies below 2.6 keV and are therefore typical of the lines used for X-ray microanalysis at low beam energies. For K-lines it is found that the experimental results are in good agreement with a Bethe, or a Casnati, crosssection model. For the L- and M-lines a Monte Carlo technique has been used to find an effective X-ray generation cross-section for each of the elements. The functional forms of these cross-sections are found to be in general agreement with proposed theoretical models.

Electron Probe Microanalysis↗
PubMed1997

Imaging thin and thick sections of biological tissue with the secondary electron detector in a field-emission scanning electron microscope.

A field-emission scanning electron microscope (FESEM) equipped with the standard secondary electron (SE) detector was used to image thin (70-90 nm) and thick (1-3 microns) sections of biological materials that were chemically fixed, dehydrated, and embedded in resin. The preparation procedures, as well as subsequent staining of the sections, were identical to those commonly used to prepare thin sections of biological material for observation with the transmission electron microscope (TEM). The results suggested that the heavy metals, namely, osmium, uranium, and lead, that were used for postfixation and staining of the tissue provided an adequate SE signal that enabled imaging of the cells and organelles present in the sections. The FESEM was also used to image sections of tissues that were selectively stained using cytochemical and immunocytochemical techniques. Furthermore, thick sections could also be imaged in the SE mode. Stereo pairs of thick sections were easily recorded and provided images that approached those normally associated with high-voltage TEM.

Animals↗
PubMed1996

Measuring the performance of scanning electron microscope detectors.

A simple digital method of measuring the performance of detectors in the scanning electron microscope (SEM) is described. The value derived is absolute and can therefore be used to compare both different detectors on the same instrument as well as different detectors on different instruments. The technique can be applied to secondary electron, backscattered electron, and energy-dispersive x-ray detectors. Examples are given of measurements made on a variety of commercial detectors installed on a number of current SEMs.

Microscopy, Electron, Scanning↗
PubMed1992

High-resolution scanning electron microscopy.

The spatial resolution of the scanning electron microscope is limited by at least three factors: the diameter of the electron probe, the size and shape of the beam/specimen interaction volume with the solid for the mode of imaging employed and the Poisson statistics of the detected signal. Any practical consideration of the high-resolution performance of the SEM must therefore also involve a knowledge of the contrast available from the signal producing the image and the radiation sensitivity of the specimen. With state-of-the-art electron optics, resolutions of the order of 1 nm are now possible. The optimum conditions for achieving such performance with the minimum radiation damage to the specimen correspond to beam energies in the range 1-3 keV. Progress beyond this level may be restricted by the delocalization of SE production and ultimate limits to electron-optical performance.

Electrons↗
PubMed1990

High resolution SE-I SEM study of enamel crystal morphology.

Until recently high resolution TEM was the only imaging mode capable of probing the atomic lattice structure of crystals composing tooth enamel. Studies designed to determine the polyhedral shape of normal enamel crystals and initiation of carious lesions in enamel crystals were hampered and limited by interpretation of two-dimensional TEM images from thin section and freeze fracture replica specimens lacking depth of field. The newly developed SE-I signal mode for SEM (SE-I/SE-II ratio) can produce images of enamel crystals approaching beam diameter dimensions (0.7-2.0 nm), rivaling the resolution of the TEM technique and generating topographic contrasts for three dimensional imaging at very high magnification (approximately 1,000,000X). Ultrathin chromium (Cr) films generate enriched high resolution SE-I contrasts of enamel crystal surfaces and when imaged using an immersion lens field emission SEM operated at high voltage (20-30 KeV) produce unsurpassed topographic contrasts. Since the grain size of Cr is below the resolution of any SEM and is ultrathin (approximately 1 nm), then SE-I images can provide a more accurate representation of enamel crystal structure than TEM methodologies. Our SE-I SEM observations of normal human enamel crystals reveal fractured spicules which contain angled flat surfaces delineated by a prominent 2 nm wide SE-I edge brightness contrast. Although microscopic observations often show crystals which are hexagonal in cross-section, in both SEM and TEM many other growth habits, including rectangular or irregular crystals (30-40 nm in width) which contain "notches," are also observed. More detailed morphological studies are therefore required to determine the most likely habit planes and their relevance to the function of the enamel crystals.(ABSTRACT TRUNCATED AT 250 WORDS)

Chromium↗
PubMed1978

Fluorinated molecule as a tracer: difluoroserotonin in human platelets mapped by electron energy-loss spectroscopy.

The intracellular distribution of fluorine has been delineated in human platelets incubated with 4,6-difluoroserotonin, utilizing a scanning-transmission electron microscope equipped with an energy-loss spectrometer. Discrete intracellular structures corresponding in location to dense bodies contained high concentrations of fluorine. Electron energy-loss spectroscopy, which apparently can detect less than 10(-20) gram of fluorine in an area of 10 square nonometers, can thus localize fluorinated tracer molecules with biological activity.

Blood Platelets↗
PubMed1976

The formation and interpretation of defect images from crystalline materials in a scanning transmission electron microscope.

The technique of scanning transmission electron microscopy (STEM) has been employed usefully in studies of amorphous materials, and the theory of image formation and interpretation in this case has been well developed. Less attention has been given to the practical and theoretical problems associated with the use of STEM for the examination of crystalline materials. In this case the contrast mechanisms are dominated by Bragg diffraction and so they are quite different from those occurring in amorphous substances. In this paper practical techniques for the observation and interpretation of contrast from defects in crystalline materials are discussed. It is shown that whilst images of defects are obtained readily under all typical STEM operating conditions, the form of the image and the information it contains varies with the angle subtended at the specimen by the detector. If this angle is too large significant image modifications relative to the "conventional" transmission electron microscope case may occur and the resolution of the image may degrade. If this angle is too small, then signal to noise considerations make an interpretation of the image difficult. In this paper we indicate how the detector angle may be chosen correctly, and also present techniques for setting up a STEM instrument for imaging a crystalline material containing lattice defects.

Crystallography↗
PubMedDate not supplied

A study of electron beam-induced conductivity in resists.

The charging of polymeric resist materials during electron beam irradiation leads to significant problems during imaging and lithography processes. Charging occurs because of charge deposition in the polymer and charge generation/trapping due to formation of electron-hole pairs in the dielectric. The presence of such charge also results in the phenomena of electron beam-induced conductivity (EBIC). Electron beam-induced conductivity data have been obtained for three commercial e-beam resists under a variety of dose rate and temperature conditions. From the observed values of induced conductivity under varying conditions significant information about the generation of electron-hole pair and the transport of charge in the resist can be obtained. Three electron beam resists, EBR900, ZEP7000, and PBS are examined by an external bias method. The difference in resist chemistry is considered to play the role in the initial state EBIC behaviors among three resists even though the way that it affects the behaviors is not clear. A comparison of the power consumption comparison is proposed as a measure to give a preliminary estimate of the carrier concentration and carrier drift velocity differences among the resists. A simple single trap model with constant activation energy is proposed and provides good agreement with experiment.

Electric Conductivity↗
PubMedDate not supplied

Microanalysis using secondary electrons in scanning electron microscopy.

A recent study of secondary electron (SE) spectra in an Auger spectrometer demonstrated unique features indicative of the chemical nature of the tested material. The scanning electron microscope (SEM) naturally generates SEs; therefore, in this paper, we combine the concept of using differential voltage contrast (DVC) with SE spectroscopy to identify the chemical nature of a material. It is demonstrated that this method reveals the uniqueness of electron energy distribution in the conduction band of a solid or, what is the same, the uniqueness of a build-up of the outer electron shell system, and avoids errors due to the changes in the angular distribution or yield of the SE in the SEM. A theory of this new microanalytical method is developed. The experimental limitations of the SEM for this type of study are examined as well.

Journal Article↗
PubMedDate not supplied

Experimental resolution measurement in critical dimension scanning electron microscope metrology.

By applying the basic principles of metrology we discuss how to define the standards that any experimental method to measure resolution has to obey. Our results clearly indicate the need to apply a calibration procedure when designing algorithms to estimate resolution to satisfy accuracy requirements. Similarly, the precision of an algorithm has to be clearly specified. We compare here the performances of a variety of commonly used implementations of published methods, with that of an algorithm based on an approach known to be reliable. Our results confirm that when an algorithm is designed with the clear intent of satisfying metrology requirements, it demonstrates excellent accuracy, precision, and lack of sensitivity to the noise level, as is desirable. As a consequence, the algorithm will have the ability to measure accurately the point spread function convoluted in the image, thus paving the way for quantitative deconvolution techniques.

Journal Article↗
PubMedDate not supplied

Measurements of absolute x-ray generation efficiency for selected K, L, and M-lines.

The absolute efficiency of generation of a selection of K, L, and M- x-ray lines has been measured as a function of the incident electron beam energy. At an overvoltage U=2 this efficiency falls within the range 1E-4 to 1E-7, with K-lines being highest and L-Lines usually being the lowest. It is shown that for all three families of lines the efficiency has a functional variation which has the form A. (U- 1)n, as first suggested by Compton and Allison, where A and n are constants. Values of A and n for the K, L, and M shells are tabulated. The smoothly varying behavior of the efficiency makes it well suited for analytical use and spectrum simulation purposes.

Journal Article↗