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B M Reichl

Publications and source records attributed to B M Reichl.

2 recordsLinked to original sources

Competitive segregation of Si and P on Fe(96.5)Si(3.5) (100) and (110).

Annealing an Fe(96.5)Si(3.5) (100)/(110) bicrystal, containing 90 ppm P, leads immediately to a strong segregation of silicon. The Si atoms, however, desegregate subsequently and are displaced by P, whose segregation enthalpy is larger than that of silicon. The corresponding surface structures formed on both faces have been studied using complementary methods: Scanning tunneling microscopy (STM) to obtain atomically resolved geometrical information and Auger electron spectroscopy (AES) for the determination of the surface composition. Si substitutes surface Fe atoms on both faces and forms ordered surface alloys, whereas P occupies hollow sites on the surface. Si and P form c(2 x 2) superstructures on the (100) surface, whereby each segregated phosphorus atom blocks in the average one silicon segregation site. The (110) surface, on the other hand, is characterized by a c(1 x 3) Si superstructure. Due to the anisotropy of this surface the P/Si exchange proceeds by the formation of silicon coverage decreasing domain boundaries within the silicon structure, which are simultaneously occupied by P atoms. Furthermore the comparison of the AES and STM derived phosphorus coverages indicates a P multilayer segregation on the (110) surface.

Journal Article↗

Data management in multi-method surface analysis.

The solution of the problem of interchangeability of surface analytical data is gaining increasing importance in multi-method surface analysis. There are various surface analytical instruments in different laboratories on several automation levels. For these instruments, which are controlled by computer systems working with proprietary software under various operating systems, a standardised data format is necessary to allow an exchange of data. Therefore, a toolkit has been developed for the transfer, archiving and editing of surface analytical data in a standardised public domain format. This format contains all available and necessary information on experimental conditions and all parameters specific for a number of analytical techniques such as AES, SAM, XPS, SIMS, STM, AFM and EPMA. Additionally, all data concerning the conditions of sample-preparation and measurement history are included in order to allow a well-founded evaluation of the data and improved reproducibility of the experiment.

Journal Article↗